The Stanford Nanocharacterization Laboratory (SNL) is situated within the Geballe Laboratory for Advanced Materials (GLAM) and is newly affilitated with the Stanford Nanofabrication Facility (SNF) and, through SNF, to the National Nanotechnology Infrastructure Network (NNIN). The SNL features an FEI Strata 235 Dual Beam SEM/FIB (combined scanning electron microscopy and focused ion beam capabilities), an FEI Sirion SEM, an FEI CM20 FEG-TEM (field emission gun transmission electron microscope) and a Philips X-Pert X-ray Diffractometer, as well as electron microprobe, x-ray photoelectron spectroscopy, scanning probe microscopy, and additional x-ray diffraction instrumentation.
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